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Oral presentation

Evaluation of radiation tolerance of phase-locked loops fabricated in 0.2-$$mu$$m FD-SOI process

Hoshino, Eijiro*; Shibata, Yuichi*; Kobayashi, Daisuke*; Kakehashi, Yuya*; Makino, Takahiro; Oshima, Takeshi; Hirose, Kazuyuki*

no journal, , 

no abstracts in English

Oral presentation

Single-event effects tests of commercial FPGAs

Shibata, Yuichi*; Kobayashi, Daisuke*; Otsuki, Masatsugu*; Makino, Takahiro; Oshima, Takeshi; Hirose, Kazuyuki*

no journal, , 

no abstracts in English

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